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August 1, 1967Applied Physics Letters

Electromigration Effects in Aluminum Film on Silicon Substrates

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JHJ. K. HowardAustralian Nuclear Science and Technology OrganisationRRR. F. RossIBM (United States)

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Howard et al. (1967) studied this question.

synapsesocial.com/papers/6a871753b712452940cbb7c2https://doi.org/10.1063/1.1755047
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