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March 1, 2007IEEE Transactions on Electron Devices

SThM Temperature Mapping and Nonlinear Thermal Resistance Evolution With Bias on AlGaN/GaN HEMT Devices

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Authors

RARaphal AubryJJJean-Claude JacquetIII V LabJWJonathan WeaverGlasgow School of Art

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Aubry et al. (2007) studied this question.

synapsesocial.com/papers/6a87f0a49a71e8b12ff4c67bhttps://doi.org/10.1109/ted.2006.890380
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