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January 3, 2003Applied Physics Letters

Measurement of temperature distribution in multifinger AlGaN/GaN heterostructure field-effect transistors using micro-Raman spectroscopy

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Authors

MKMartin KuballUniversity of BristolSRS. RajasingamUniversity of BristolASAndrei SaruaUniversity of Bristol

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Kuball et al. (2003) studied this question.

synapsesocial.com/papers/6a6bf06d050bc01bbbcb8de3https://doi.org/10.1063/1.1534935
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