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November 10, 1997Applied Physics Letters

Measurement of piezoelectrically induced charge in GaN/AlGaN heterostructure field-effect transistors

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Authors

EYEdward T. YuStevens Institute of TechnologyGSG.J. SullivanAlexander T. Augusta Military Medical CenterPAP.M. AsbeckUniversity of California, San Diego

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Yu et al. (1997) studied this question.

synapsesocial.com/papers/6a87f0e0a95381ace1bbed9bhttps://doi.org/10.1063/1.120138
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