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February 2, 2005Electronics Letters

Effects of AlGaN/GaN HEMT structure on RF reliability

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Authors

CLC. LeeLWL. WitkowskiHTH.Q. Tserng

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Lee et al. (2005) studied this question.

synapsesocial.com/papers/6a87f110cb36de311aaa6155https://doi.org/10.1049/el:20057802
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