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June 1, 1992Journal of Applied Physics

In situ monitoring and Hall measurements of GaN grown with GaN buffer layers

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Authors

Shuji Nakamura
Shuji NakamuraNEC (Japan)
TMTakashi MukaiNational Institute of Advanced Industrial Science and TechnologyMSMasayuki SenohNichia Corporation (Japan)

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Nakamura et al. (1992) studied this question.

synapsesocial.com/papers/6a87f144aaaef52b1e4de6c9https://doi.org/10.1063/1.350529
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