Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
June 8, 1998Applied Physics Letters

Determination of the cubic to hexagonal fraction in GaN nucleation layers using grazing incidence x-ray scattering

View Full Paper
Ask AI
Bookmark
Share

Authors

AMA. MunkholmArgonne National LaboratoryCTCarol ThompsonNorthern Illinois UniversityCFC. M. FosterUniversity of North Carolina at Chapel Hill

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Munkholm et al. (1998) studied this question.

synapsesocial.com/papers/6a87f146657a5e32d1aa6163https://doi.org/10.1063/1.121511
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1High-Luminosity Blue and Blue-Green Gallium Nitride Light-Emitting Diodes1995 · 409 citations
  2. 2InGaN-Based Multi-Quantum-Well-Structure Laser Diodes1996 · 2,504 citations
  3. 3Metalorganic vapor phase epitaxial growth of a high quality GaN film using an AlN buffer layer1986 · 2,214 citations
  4. 4Sources of Inhomogeneity and Their Effects on the Asymmetry of the Ferromagnetic Resonance Lineshapes of Single Crystal Nickel Films1991 · 54 citations
  5. 5Structural evolution in epitaxial metalorganic chemical vapor deposition grown GaN films on sapphire1995 · 320 citations