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September 1, 1985IEEE Electron Device Letters

A new relationship between the Fukui coefficient and optimal current value for low-noise operation of field-effect transistors

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Authors

DDD. DelagebeaudeufTechnicolor (France)JCJoël ChevrierUniversité Grenoble AlpesMLM. LavironCentre National de la Recherche Scientifique

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Delagebeaudeuf et al. (1985) studied this question.

synapsesocial.com/papers/6a887b578dfe8b7ec5a54bb4https://doi.org/10.1109/edl.1985.26186
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