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December 19, 1988Applied Physics Letters

Thickness and annealing dependence of the superconducting transition temperature of YBa2Cu3O7−x thin films on oxidized silicon and polycrystalline alumina substrates

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Authors

AMA. Mogro‐CamperoGeneral Electric (United States)LTL. G. TurnerGeneral Electric (United States)GKG. KendallUniversity of Liverpool

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Mogro‐Campero et al. (1988) studied this question.

synapsesocial.com/papers/6a887be3e7b4eb5f6b07cd0ehttps://doi.org/10.1063/1.100533
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