A high-resolution study of x-ray scattering from a laterally structured surface is reported. Total external reflection displays a distinct dip in the reflectivity for incident angles ϑ < ϑ c (critical angle) and around a Bragg peak a system of truncation rods is found. Generalized Fresnel equations in conjunction with a kinematical theory provide a quantitative explanation of both findings. The method is well suited for characterising modulations on a mesoscopic length scale.
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Tolan et al. (1992) studied this question.
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