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April 1, 1978Applied Physics LettersOpen Access

A high-resolution electron microscopy study of the Si-SiO2 interface

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Authors

OKOndrej L. KrivanekBruker (United States)TST. T. ShengNational Taichung University of Science and TechnologyDTD. C. TsuiPrinceton University

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Krivanek et al. (1978) studied this question.

synapsesocial.com/papers/6a893de5abe412682d92d1f7https://doi.org/10.1063/1.90077
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