Laser Induced Electrical Transients at Semiconductor Electrodes

Laser‐induced electrical transients (LET) are described in a model with two capacitors in series, two current source terms, a measuring resistor, and a resistor for the system. Calculated and experimental LET signals at semiconductor electrodes are shown for characteristic kinetic situations in three different time windows t < τ, t comparable to τ, and t > τ, where τ represents the RC response time of the circuit.