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March 17, 2004Microscopy and Microanalysis

High-Resolution Transmission Electron Microscopy Using Negative Spherical Aberration

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CJChun‐Lin JiaYantai UniversityMLMarkus LentzenForschungszentrum JülichKUK. UrbanForschungszentrum Jülich

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Jia et al. (2004) studied this question.

synapsesocial.com/papers/6a895a5ac89a2b4713ec657bhttps://doi.org/10.1017/s1431927604040425
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