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January 1, 1999Journal of Electron Microscopy

A way to higher resolution: spherical-aberration correction in a 200 kV transmission electron microscope

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Authors

KUK. UrbanForschungszentrum JülichBKB. KabiusPennsylvania State UniversityMHM. HaiderNanjing Normal University

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Cite This Study

Urban et al. (1999) studied this question.

synapsesocial.com/papers/6ab1e5b779aa19ee2018dfbchttps://doi.org/10.1093/oxfordjournals.jmicro.a023753
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