An SI thyristor with new gate and shorted p-emitter structures (DTT-SI thyristor) is proposed to realize a high-voltage high current high-speed device having a low forward voltage drop. Investigations using fabricated 2.5-kV 100-A DTT-SI thyristors and numerical analyses show that the DTT-SI thyristor has a good trade-off between the forward voltage drop and switching characteristics when the channel width is 8-10 µm and the maximum impurity concentration is about 1 × 1017to 4 × 1017cm-3. The typical fabricated DTT-SI thyristor has a 2.5-kV forward blocking voltage with a 58-V reverse gate bias voltage, a 1.4-V forward voltage drop with a 100-A anode current, a 2- µs turn-on time, adi/dtcapability higher than 4000 A/µs, and can interrupt a 900-A anode current with a 3.5-µs turn-off time and a 5.6 gate turn-off gain on application of a 100-V reverse gate bias voltage.
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Terasawa et al. (1986) studied this question.
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