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July 1, 1976Journal of Vacuum Science and Technology

Field dependent internal photoemission probe of the electronic structure of the Si–SiO2 interface

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TDT. H. DiStefanoIBM Research - Thomas J. Watson Research Center

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T. H. DiStefano (1976) studied this question.

synapsesocial.com/papers/6a897b785edafe343d92e1ed https://doi.org/10.1116/1.569003

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