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A transform is described for analyzing scanning-probe-microscope images. This radial-histogram transform is shown to contain useful information for ascertaining the structure of an object in a scanning-probe-microscope image. The radial-histogram transform also allows quantitative assessment of tip dilation effects. The utility of the transform is illustrated by analyzing a noncontact atomic force microscope image of a nanometer size Au cluster supported on a mica substrate. Using the radial-histogram transform, detailed information about the faceting, structure, and orientation of the supported nanometer-size cluster is obtained.
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Schleef et al. (1997) studied this question.
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