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June 30, 2004IEEE Photonics Technology Letters

Size Influence on the Propagation Loss Induced by Sidewall Roughness in Ultrasmall SOI Waveguides

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FGFrédéric GrillotTélécom ParisLVLaurent VivienCentre National de la Recherche ScientifiqueSLS. LavalLimousin Regional Council

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Grillot et al. (2004) studied this question.

synapsesocial.com/papers/6a89d2cfd28e9db871fd4646https://doi.org/10.1109/lpt.2004.828497
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