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August 1, 1994IEE Proceedings - Optoelectronics

Effect of side wall roughness in buried channel waveguides

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Authors

FLFrançois LadouceurUNSW SydneyJLJ.D. LoveAustralian National UniversityTSTim J. SendenAustralian National University

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Cite This Study

Ladouceur et al. (1994) studied this question.

synapsesocial.com/papers/6a8cee8f58db4b48d8967fc5https://doi.org/10.1049/ip-opt:19941085
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