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February 1, 1983IEEE Transactions on Microwave Theory and Techniques

Precise Millimeter-Wave Measurements of Complex Refractive Index, Complex Dielectric Permittivity and Loss Tangent of GaAs, Si, SiO/sub 2/, A1/sub 2/O/sub 3/, BeO, Macor, and Glass

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MAMohammed N. AfsarTufts UniversityKBKenneth ButtonGeorge Mason University

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Afsar et al. (1983) studied this question.

synapsesocial.com/papers/6a8a525bb4e829b19bd479ffhttps://doi.org/10.1109/tmtt.1983.1131460
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