The dielectric function epsilon identical with epsilon(1) + iepsilon(2) of evaporated SiO films is reported for the wavelength region from 8 to 33 microm. The data are based on spectrophotometric measurements of reflectance and transmittance for films evaporated onto KRS-5 and crystalline Si and on reflectance measurements on films evaporated onto opaque Al layers. The consistency in the results for epsilon(1) and epsilon(2) is verified by the Kramers-Kronig analysis.
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Hjortsberg et al. (1980) studied this question.
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