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Using a capacitively controlled force microscope we have imaged typical domain wall configurations like 90° closure structures and subdivided 180° wall segments in single-crystal iron whiskers. Differences in wall contrast between 90° and 180° domain walls are clearly observed. The effect of tip-to-sample distance on lateral resolution and wall contrast in magnetic force microscopy is shown.
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Göddenhenrich et al. (1990) studied this question.
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