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December 23, 2014Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Comparison of defects in crystalline oxide semiconductor materials by electron spin resonance

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Authors

TMTokiyoshi MatsudaRyukoku UniversityMKMutsumi KimuraRyukoku University

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Matsuda et al. (2014) studied this question.

synapsesocial.com/papers/6a8a91f00e1a8f7244fd83cfhttps://doi.org/10.1116/1.4904400
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