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May 1, 1986Journal of Applied Physics

Self-consistent calculation of electron and hole inversion charges at silicon–silicon dioxide interfaces

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CMC. MoglestueCatholic University of Applied Sciences Freiburg

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C. Moglestue (1986) studied this question.

synapsesocial.com/papers/6a8a92f3a90c2f4c44fbc54ahttps://doi.org/10.1063/1.336898
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