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The interference fringe caused by lattice distortion around a defect is observed in the resonant scattering X‐ray topography for the GaAs 200 reflection in the Laue case. The amplitude of the fringe can be maximized when the Fourier transform of the imaginary part of X‐ray polarizability χhi is zero. The fringe position relative to the defect shifts when the incident angle is varied, and the fringe spacing changes as a function of the distance from the defect. A kinematical image can be distinguished from a dynamical one by observing the image position when the incident angle is varied in the case of χhi = 0. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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Negishi et al. (2007) studied this question.
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