Key result
Transcatheter closure for postinfarction ventricular septal defect achieved a pooled successful device implantation rate of 89.7% (95% CI 0.772-1.021) and a 30-day mortality of 31.5%.
Why the study?
Postinfarction ventricular septal defect is a severe complication of acute myocardial infarction, and this study examined published literature to provide objective evidence for transcatheter closure.
What are the efficacy and safety outcomes of transcatheter closure in patients with postinfarction ventricular septal defect?
Meta-Analysis (n=462)
What are the efficacy and safety outcomes of transcatheter closure in patients with postinfarction ventricular septal defect?
Transcatheter closure is a relatively safe and minimally invasive option for postinfarction ventricular septal defect, with high device implantation success and acceptable 30-day mortality, though comparative trials are needed.
Transcatheter closure is feasible for postinfarction VSD yet carries substantial early mortality; leaves open the need for randomized comparisons to surgery.
OBJECTIVE: Postinfarction ventricular septal defect (PIVSD) is a severe complication of acute myocardial infarction (AMI). Transcatheter closure (TCC) is an alternative option to surgical repair. This study was undertaken to examine the published literature to provide objective evidence for TCC using a meta-analysis. METHODS: We searched for significant medical and publisher databases. Two reviewers checked the quality of the studies and extracted data. Eligible studies included single-arm studies and comparative studies. Weighted means, pooled event rates, efficacy outcomes and odds ratios (ORs) for immediate shunt reduction (ISR), presence of cardiogenic shock (CS), New York Heart Association (NYHA) class IV, time from AMI to ventricular septal defect (VSD), and time to VSD closure was estimated. RESULTS: A total of 27 single-arm articles (462 patients) were included. The pooled event rate was 89.7% (95% confidence interval [CI]: 0.772-1.021) for successful device implantation, 80.9% (95% CI: 0.645-0.972) for ISR, 31.5% (95% CI: 0.149-0.482) for 30-day mortality, and 25.3% (95% CI: 0.072-0.434) for 30-day mortality of primary closure at the acute phase. CS (OR = 3.607, 95% CI: 2.301-5.653), NYHA class IV (OR = 6.491, 95% CI: 1.444-29.188) and time to VSD closure were risk predictors for TCC. There was no correlation between defect size (OR = 2.592, 95% CI: 0.380-17.661) and mortality. CONCLUSION: TCC should be a relatively safe and minimally invasive method for PIVSD, with an excellent successful device implantation rate and acceptable low 30-day mortality. The procedure appears promising, but its safety and efficacy could only be demonstrated by randomized controlled trials. Therefore, the mortality of data comparing surgery to TCC compels the need for future comparative trials.
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Yang et al. (2021) conducted a meta-analysis in Postinfarction ventricular septal defect (PIVSD) (n=462). Transcatheter closure (TCC) was evaluated on successful device implantation (95% CI 0.772-1.021). Transcatheter closure for postinfarction ventricular septal defect achieved a pooled successful device implantation rate of 89.7% (95% CI 0.772-1.021) and a 30-day mortality of 31.5%.
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