The dielectric properties of some potential substrate materials for the high-Tc superconducting film were measured at 5 to 11 GHz by using different microwave resonance techniques at 300 K and 77 K. The dielectric constants and quality factors of ceramics Ba(Mg1/3Ta2/3)O3, Sr(Al1/2Ta1/2)O3, Sr(Al1/2Nb1/2)O3, Sr(Ga1/2Ta1/2)O3, and their solid solutions with NdGaO3 and LaAlO3 were measured. These materials have shown dielectric constants in the range 10.7 to 26.9 and quality factors 1,750 to 35,200 at 77 K. Discussions about the suitable microwave measurement techniques are also given. The accuracies for both the dielectric constant and the quality factor measurements are within 2%.
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Sheen et al. (1993) studied this question.
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