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The perpendicular magnetoconductance has been measured for thin niobium films (R_=47--218 {Ω}) for temperatures from near the superconducting transition temperature Tc to 20 K. The electron phase-coherence lifetime has been determined by analyzing magnetoconductance data, using the theories of localization and superconducting fluctuation effects in thin films. This electron lifetime is interpreted in terms of electron-electron and electron-phonon scattering mechanisms.
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Dalrymple et al. (1986) studied this question.
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