A new computational method of obtaining optical constants from reflectance ratio measurements

A rapid accurate computational procedure has been devised for obtaining n and k from reflectance ratio values measured at two angles of incidence, θ 1 and θ 2 . This technique has been used to study the sensitivity of the reflection ratio method, and it is shown that the errors are less than 2% in the product nk ( nk less-than-or-eq, slant 6), when the reflection ratios are in error by ±0·005, or θ 1 and θ 2 are in error by ±0·1°, for measurements in the angular ranges 58° less-than-or-eq, slant θ 1 less-than-or-eq, slant 67° and 80° less-than-or-eq, slant θ 2 less-than-or-eq, slant 81°.