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In-plane remanence properties of Co-Cr-Ta thin films have been previously investigated in order to quantify magnetic interaction effects parallel to, and transverse to, the transfer direction. Samples were prepared at two deposition rates of the Cr underlayer. Magnetic layers deposited on high deposition rate Cr underlayer had lower peak heights of /spl Delta/I and small coefficients of.
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Suzuki et al. (1995) studied this question.
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