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We report the successful demonstration of large current and high-speed switching properties of SiC V-groove trench gate MOSFETs (VMOSFETs). A drain current of 150 A (at V DS = 2 V and V GS = 18 V) and breakdown voltage of 960 V were achieved from a packaged 6 × 6 mm2 single chip. Moreover, short switching times of t r = 81 ns and t f = 32 ns were also obtained. To fabricate such VMOSFETs with high yield, highly uniform in-house epitaxial growth technology on a 150-mm-diameter wafer is also one of the keys, owing to its characteristic dependence on drift layer carrier concentration.
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Saitoh et al. (2016) studied this question.
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