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A value of the constant D0Z* for grain boundary electromigration in alluminum thin films is determined to be 3(± 0.5) × 10−2. Generalized curves are provided for (v̄i/j)T against T−1 for aluminum films. These curves can be used to obtain appropriate ionic velocities at any temperature or current density for films of known grain size.
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R. Rosenberg (1970) studied this question.
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