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Application of synchrotron-radiation-based x-ray microprobe techniques for the analysis of recombination activity of metals precipitated at Si/SiGe misfit dislocations, O F Vyvenko, T Buonassisi, A A Istratov, E R Weber, M Kittler, W Seifert
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Вывенко et al. (2002) studied this question.
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