We found the regeneration of perpendicular exchange bias at high temperature in the Pt-capping/Co/Pt-spacer/α-Cr 2 O 3 /Pt-buffer thin film with an ultrathin (0.2 nm) Pt-spacer layer after the disappearance at low temperature. Abrupt changes in the coercivity accompany the abrupt disappearance and regeneration of exchange bias. The direction of the regenerated exchange bias could be reversed by altering the ferromagnetic spin orientation during temperature rise. The exchange bias did not regenerate when the Pt spacer layer was grown at a slow growth rate, suggesting that the growth mode of Pt on the α-Cr 2 O 3 layer affects the regeneration feature.
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Shiratsuchi et al. (2013) studied this question.
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