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June 1, 1980Japanese Journal of Applied PhysicsOpen Access

Reflection Electron Microscope Observations of Dislocations and Surface Structure Phase Transition on Clean (111) Silicon Surfaces

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NONobuyuki OsakabeHitachi (Japan)KYKatsumichi YagiTokyo Institute of TechnologyGHGoro HonjoTokyo Institute of Technology

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Osakabe et al. (1980) studied this question.

synapsesocial.com/papers/6a9100b754f9004c52e1b440https://doi.org/10.1143/jjap.19.l309
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  1. 1Some New Techniques in Reflection High Energy Electron Diffraction (RHEED) Application to Surface Structure Studies1977 · 289 citations
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