A microcomputer-controlled multichannel analyzer system using a television camera equipped with a high sensitivity image-orthicon has been developed to perform spectral measurements of rather weak picosecond light pulses emitted or scattered by materials with sufficient sensitivity and accuracy. The features of the system are, 1) the mode-locked laser, the television camera and the microcomputer-controlled multichannel analyzer are operated synchronously, 2) the background noise of the television camera is eliminated by the subtraction process, 3) the improvement of the signal-to-noise ratio is achieved by the accumulation process of the spectral data obtained by repetitive laser operation, and 4) by monitoring laser output power, only suitable data are selected. To demonstrate the performance of the system developed, results of measurements for picosecond time-resolved luminescence spectra of CdSe are presented.
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Tanaka et al. (1979) studied this question.