CoCr17Ta5 films with Ti/TiCr10 underlayers are prepared using an UHV sputtering system. These films show good magnetic and crystallographic properties for perpendicular recording media. Higher output and lower noise characteristics are obtained for recording densities over 200kFCI with a Co-Cr-Ta/Ti/Ti-Cr perpendicular disk when compared with a Co-Cr-Ta/Cr longitudinal disk prepared using the same sputtering system.
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Matsuda et al. (1994) studied this question.
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