The 50-Hz plasma enhanced chemical vapor deposition technique allowed the deposition of high-quality SiO2 onto GaAs at room temperature without destroying the surface structure of amorphous-As covered GaAs, resulting in the stable SiO2/As/GaAs passivation system. Abrupt carrier profiles were reproducibly obtained for the Si-implanted and rapid thermal annealed GaAs using this passivation system.
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Hashizume et al. (1994) studied this question.
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