Mid-infrared electroluminescence from a Ge/Ge0.922Sn0.078/Ge double heterostructure p-i-n diode on a Si substrate

We report the observation of mid-infrared room-temperature electroluminescence from a p-i-n Ge/Ge0.922Sn0.078/Ge double heterostructure diode. The device structure is grown using low-temperature molecular beam epitaxy. Emission spectra under various injection current densities in the range of 318 A/cm2–490 A/cm2 show two distinct profiles peaked at 0.545 eV (2.275 μm) and 0.573 eV (2.164 μm), corresponding to indirect and direct bandgaps of the Ge0.922Sn0.078 active layer, respectively. This work represents a step forward towards the goal of an efficient direct-bandgap GeSn light-emitting device on a Si substrate by incorporating higher Sn content of 7.8% in a diode structure that operates at lower current densities.