The elastic energy associated with alloy composition modulation in the epitaxial film of a III-V semiconductor alloy on the [001]-substrate is calculated in the analytic form. Composition modulation both in the directions parallel to the substrate surface and in the growth direction are taken into account. It is shown that the minimum of the elastic energy corresponds to the modulation along the [100]- (and/or [010]-) direction, the period of the modulation d being small compared to the film thickness h (d≪h). The ‘‘soft mode’’ of composition modulation is exponentially localized near the free surface, the localization length l being l=d/2π. The elastic energy caused by this modulation is less by the factor 1/2c11/(c11+c12) than the elastic energy corresponding to spinodal decomposition in the bulk sample. This factor is ≊1/3 for III-V alloys. Critical temperatures of spinodal decomposition Tc are calculated for a number of epitaxial ternary III-V alloys. The diffusion which occurs only in the very thin subsurface layer (nearly monolayer) is shown to provide exponential amplification of the composition modulation amplitude δc(0)∼exp(Δh/l) at early stages of the subsequent layer-by-layer growth.
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Ipatova et al. (1993) studied this question.
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