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January 1, 1965Applied Physics Letters

Reversible Changes in Transistor Characteristics Caused by Scanning Electron Microscope Examination

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Authors

DGD. GreenWestinghouse Electric (United States)JSJ. E. SandorRedondo Optics (United States)TOT.W. O'KeeffeWestinghouse Electric (United States)

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Green et al. (1965) studied this question.

synapsesocial.com/papers/6a92fe1fc9cc64515e7f4fc5https://doi.org/10.1063/1.1754122
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