Indirect boundary element method applied to generalized microstripline analysis with applications to side-proximity effect in MMIC's

A novel analysis of the electrical properties of the microstrip-like structures with generalized configuration by means of the indirect boundary element method (BEM) is proposed. In this method, the basic boundary-integral equation is derived by choosing an appropriate fundamental solution and the numerical calculation is done by considering the root-singularity of the boundary distribution on the strip conductor. As an application, the proximity effects in monolithic microwave integrated circuits (MMICs) are calculated. By curve-fitting, the numerical results are expressed in a polynomial suitable for CAD for MMICs.>