Metal Surface Current Density Fast Imaging via a Hx and Hy Simultaneous Near‐Field Probing System

This paper presents a fast metal surface current density acquisition technology. Different from traditional current imaging algorithms using the Biot‐Savart law with two magnetic fields measured separately, the proposed technology employs a enhanced current density imaging method with horizontal dual magnetic fields and simultaneous probing system. The proposed technology is capable of quickly obtaining and simultaneously and at the same location, which can improve the accuracy of dual magnetic field collaborative measurement, avoiding errors caused by changing single‐component and probes. Furthermore, this technology enables non‐contact detection of current within a specific frequency band using a network analyzer. Simulation and experimental results demonstrate that the method can rapidly acquire the current distribution on the surface of the device under test, with imaging speed nearly doubled compared to single‐probe measurement, while providing reconstructed current results superior to those of Fourier methods.