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May 16, 2006Microscopy and Microanalysis

Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy Using Hardware Aberration Correction

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MLMarkus LentzenForschungszentrum Jülich

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Markus Lentzen (2006) studied this question.

synapsesocial.com/papers/6a93e0c1948b7e3210fec9f7https://doi.org/10.1017/s1431927606060326
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