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April 15, 1981Applied Physics Letters

Identification of electron traps in thermal silicon dioxide films

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Authors

AHA. HartsteinIBM Research - Thomas J. Watson Research CenterDYDonald R. YoungVirginia Commonwealth University

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Hartstein et al. (1981) studied this question.

synapsesocial.com/papers/6a94059fae615e787043da4ehttps://doi.org/10.1063/1.92459
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