Answers are grounded in this paper and cite their sources.
An on‐wafer method using coplanar probes for characterizing heterostructure diodes is proposed. Parameters are extracted by fitting a circuit model to a measured reflection coefficient over a broad frequency range. The test structure can be easily fabricated.
No takes yet. Share an insight, caveat, or question.
Stake et al. (1995) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: