Answers are grounded in this paper and cite their sources.
A large number of measurements have been carried out on 11 different slices of GaAs and on devices fabricated from these slices. This has made it possible to establish a useful correlation between the impurity profiles of the GaAs slices and the microwave performance of devices fabricated from them.
No takes yet. Share an insight, caveat, or question.
Colliver et al. (1970) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: