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The electrochemical etching of p-CdTe is investigated. This etching is based on a method used previously for the selective etching of n-type Cd-chalcogenide semiconductors. We show that the electrochemical etching creates a dense pattern of submicron pits, and increases the reverse bias photocurrent of a Schottky barrier device, made up of single crystal p-CdTe and a polysulfide electrolyte typically by 20%. Evidence for the selective removal of surface defects is brought up and the conditions for selective etching are discussed in brief.
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Reshef Tenne (1983) studied this question.
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