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The published literature contains little information on the acoustic properties of thin dielectric films produced by sputter deposition. The longitudinal velocity and impedance of a sputter-deposited glass film, one-quarter wavelength thick, has been measured in the vicinity of 400 MHz. Such a layer produces a near-optimum acoustic power transfer between sapphire and water. Curve fitting the predicted return loss against frequency to the experimental impedance transformer response provides a convenient method for the determination of the layer’s acoustic properties.
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R.D. Weglein (1976) studied this question.
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