The electrical properties of thin-film CuInSe2 (<4 μm thick) deposited by coevaporation of the elements have been measured by different techniques as a function of material composition. A correlation between the Cu/In and Se/metal ratios versus majority-carrier concentration is established. A qualitative scheme is developed, based on experiments, which predicts the majority-carrier type and concentration in relation to the stoichiometry of the material.
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Noufi et al. (1984) studied this question.
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